Modeling of Electrical Overstress in Integrated Circuits formatIsbn:Softcover - 9781461362050 2Controlling-Ansätze6

2Controlling-Ansätze6

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Modeling of Electrical Overstress in Integrated Circuits formatIsbn:Softcover - 9781461362050 2Controlling-Ansätze6Electrical overstress (EOS) and Electrostatic discharge (ESD) pose one of the most dominant threats to integrated circuits (ICs). These reliability concerns are becoming more serious with the downward scaling of device feature sizes. Modeling of Electrical Overstress in Integrated Circuits presents a comprehensive analysis of EOS ESD related failures in I O protection devices in integrated circuits. The design of I O protection circuits has been done